Article

Item Overexposure in Computerized Classification Tests Using Sequential Item Selection

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Abstract

Computerized classification tests (CCTs) often use sequential item selection which administers items according to maximizing psychometric information at a cut point demarcating passing and failing scores. This paper illustrates why this method of item selection leads to the overexposure of a significant number of items, and the performances of three different methods for controlling maximum item exposure rates in CCTs are compared. Specifically, the Sympson-Hetter, restricted, and item eligibility methods are examined in two studies realistically simulating different types of CCTs and are evaluated based upon criteria including classification accuracy, the number of items exceeding the desired maximum exposure rate, and test overlap. The pros and cons of each method are discussed from a practical perspective. Accessed 5,558 times on https://pareonline.net from June 06, 2012 to December 31, 2019. For downloads from January 1, 2020 forward, please click on the PlumX Metrics link to the right.

Keywords: Test Construction

How to Cite:

Huebner, A., (2012) “Item Overexposure in Computerized Classification Tests Using Sequential Item Selection”, Practical Assessment, Research, and Evaluation 17(1): 12. doi: https://doi.org/10.7275/nr1c-yv82